ICCAD Acceptance Rate and Submission Statistics

IEEE/ACM International Conference on Computer Aided Design is tracked by CS Conf Stats as a EDA conference. The dataset covers 28 events from 1993-2024.

ICCAD 2024 accepted 195 papers out of 802 submissions, for an acceptance rate of 24.3%.

Official website | Proceedings

Latest Acceptance Rate
24.3%
2024: 195 accepted / 802 submitted
Years Covered
28
1993-2024
Discipline
EDA
Electronic Design Automation, Hardware & System Design Optimization

Yearly Statistics

Year Location Accepted Submitted Acceptance Rate Second Track Note
2024 Newark, USA 195 802 24.3%
2023 San Francisco, California, USA 172 750 22.9%
2022 San Diego, California, USA 132 595 22.2%
2021 Online, Online 121 514 23.5%
2020 Online, Online 127 470 27.0%
2019 Westminster, USA 94 394 23.9%
2018 San Diego, California, USA 98 400 24.5% Approximately 400
2017 Irvine, California, USA 105 399 26.3%
2016 Austin, USA 97 409 23.7%
2015 Austin, USA 94 382 24.6%
2014 San Jose, California, USA 77 304 25.3%
2013 San Jose, California, USA 92 354 26.0%
2012 San Jose, California, USA 82 338 24.3%
2011 San Jose, California, USA 106 349 30.4%
2010 San Jose, California, USA 108 360 30.0%
2009 San Jose, California, USA 115 438 26.3%
2008 San Jose, California, USA 122 458 26.6%
2007 San Jose, California, USA 139 510 27.3%
2005 San Jose, California, USA 128 540 23.7%
2004 San Jose, California, USA 127 520 24.4%
2003 San Jose, California, USA 129 490 26.3%
2002 San Jose, California, USA 105 381 27.6%
2001 San Jose, California, USA 92 301 30.6%
2000 San Jose, California, USA 86 265 32.5%
1999 San Jose, California, USA 102 318 32.1%
1998 San Jose, California, USA 102 345 29.6%
1995 San Jose, California, USA 108 350 30.9%
1993 Santa Clara, California, USA 129 420 30.7% Over 420 papers

Conference Details

Full Title
IEEE/ACM International Conference on Computer Aided Design
Main Discipline
Electronic Design Automation, Hardware & System Design Optimization
Other Topics
Formal Methods & Verification, Embedded Systems & IoT, Design for Manufacturability & Yield, ML in EDA, Cyber-Physical Systems & Security
Parent Organization
IEEE, ACM
Notes
No conference-level note is recorded.

More ICCAD Pages

Interactive chart: ICCAD on the main CS Conf Stats chart.

Related EDA conferences: DAC.